Sorting system



R. F. 'ZURCHER SORTING SYSTEM Aug. 25, 1970 7 Sheets-Sheet 1 Filed 001;.21, 1968 AWIM/az @001; A zaea/zz,

Aug. 25, 1970 soR'TiNe SYSTEM Filed Oct. 21, 1968 V 7 Sheets-Sheet 2SORTING SYSTEM '7 Shets-Sheet 15 Filed Oct. 21, 1968 dra Aug. 25, 1970'R. F; ZURCH-ER SORTING SYSTEM 7 Sheets-Sheet 4 Filed Oct. 21, 1968 R. F.ZURCHER SORTING SYSTEM Aug. 25, 1970 7 Sheets-Sheet 6 Filed Oct. 21,1968 Aug. 25, 1970 SORTING SYSTEM Filed Oct. 21, 1968 R. F. 'ZURCHER3,525,432.

7 Sheets-Sheet 7' United States Patent 3,525,432 SORTING SYSTEM RudolfF. Zurcher, Los Angeles, Calif., assignor, by mesne assignments, to GTICorporation, Meadville, Pa., a corporation of Rhode Island Filed Oct.21, 1968, Ser. No. 769,233 Int. Cl. B07c /344 US. Cl. 209-73 19 ClaimsABSTRACT OF THE DISCLOSURE This disclosure relates to a system capableof highspeed sorting of miniature parts (chips). A valve controlledvacuum transfer arm mechanically cycles between a vibratory feeder bowland a contacting platform'to pick up a miniature part at the bowlfeedout point, deliver the part to the contacting platform of acontacting mechanism, and then return to the bowl for another such'part.The delivered parts are mechanically contacted, tested, classified, andsorted into appropriate classification receptacles. A clutch is providedfor automatically stopping the transfer arm at an intermediate positionbetween the bowl and the contacting platform so that sorting of apreviously delivered part may be effected before another part can bedelivered. The clutch is controlled by a solenoid so that when anelectrical signal, derived from the contacting operation, is received bythe solenoid the transfer arm will be permitted to proceed from orthrough the intermediate position to the contacting platform.

This invention relates to a new and improved sorting system of the typecapable of high speed sorting of miniature parts (chips) employing aclutch arrangement for effecting unique coaction of a transferringmechanism, a contacting mechanism, and other components of the system.

A previously developed electromechanical system for sorting miniatureparts (miniature parts are herein generically defined as chips)included, inter alia, a chip transferring mechanism and a contactingmechanism. The transferring device had a transfer arm for transferringminiature parts or chips from a vibratory feeder bowl to a supportsurface, and the contacting mechanism had a contact arm for contacting achip placed on the support surface. The contact arm was operablyconnected toelectronic equipment capable of testing and classifyingchips. The contacting mechanism and the electronic equipment wereassociated with classification receptacles. Each classificationreceptacle was attached to a respective movable guide tube. Theelectronic equipment was operable to actuate a solenoid associated witha selected guide tube after the classification of a chip had beendetermined, and an ejector arm of the contacting mechanism was operableto push the classified chip into the actuated guide tube. In operation achip was transported, contacted, tested, classified and sorted. Amultiplicity of such chips were sorted by repeating this operationcycle. This prior system utilized a motor for operating both thetransfer arm and the contact arm.

In a semiautomatic version of this system the electrical circuit for themotor was automatically deenergized after each complete revolution ofthe motor and at a time in the operation cycle when the vacuum nozzle ofthe transfer arm was proximate to the feed out point of the vibratoryfeeder bowl. The person operating the system, when desiring to effectanother operation cycle, pushed a start button thereby causingmechanical contacting of a chip on the support surface, the start oftesting and classifying of such chip, and the energization of the motorat the end of classifying. The motor shaft then 3,525,432 Patented Aug.25, 1970 "ice rotated, thus causing the transfer arm to move so thatanother chip, obtained from the vibratory feeder bowl by the vacuumnozzle, was transported to the support surface. This latter chip wasplaced on the support surface when the motor shaft had completed abouthalf of a revolution. The motor shaft continued rotating, thus effectingreturn of the transfer arm to its initial position wherein the vacuumnozzle was again proximate to the feedout point of the vibratory feederbowl, until the motor was again stopped by automatic deenergization ofthe power circuit of the motor.

In an automatic version of this system the motor continued rotatingindefinitely, without stopping, through a multiplicity of cycles. Thusthe transfer arm did not dwell or rest with the vacuum nozzle proximateto the feedout point for an indefinite time interval as was the case inthe semiautomatic version.

In both versions the requisite vacuum at the vacuum nozzle was producedby employing an airpot and check valve arrangement. The airpot consistedof a reciprocable piston mounted in an air cylinder. The piston wascoupled to the motor so as to reciprocate back and forth during eachrevolution of the motor. The piston was arranged to move outwardly ofthe air cylinder during the chip delivery portion of the transfer armcycle, thus drawing air into the vacuum nozzle so that a chip could beattracted to and held by the nozzle. During the return of the arm andthus the nozzle to the vibratory feeder bowl, the piston moved inwardlyof the air cylinder, thus expelling air through the nozzle. The checkvalve assisted in regulating the flow of air to and from the nozzle, aswas found desirable, when very minute, light weight chips were to betransported; this check valve could be deleted when relatively larger,heavier chips were to be transported.

These versions of the prior system, while advantageous in many respects,were, in practice, found to be subject to certain limitations. Thus, forexample, in the semiautomatic version the stopping and starting of themotor sometimes produced spurious electrical transients which interferedwith the electrical testing and classifying of contacted chips andsometimes produced false signals to the solenoids utilized inconjunction with associated classification receptacles.

A limitation of the automatic version was the fixed time elapsing duringeach complete cycle of the transfer arm. Initial contacting, testing,and classifying of a chip occurred while the transfer arm was returningto the feedout point of the vibratory feeder bowl to pick up a new chip,but the sorting operation could not occur until sometime after thetransfer arm began delivery of the new chip. The time required forinitial contacting, testing, and classifying dictated the maximum speedat which the motor could cycle the transfer arm. Since the test timedepended on the particular classification to be made, the minimum timeinterval for the transfer arm cycle was designed to accommodate thelongest foreseeable testing time. Thus, in particular applicationsinvolving shorter test times, a portion of the transfer arm cycle timewas wasted as far as the electronic classification equipment wasconcerned.

Another limitation, common to both the semiautomatic and automaticversions, arose from the fact that the associated testing andclassifying equipment was capable of performing its operations in a veryshort time relative to the time required for the transfer arm to movethe nozzle from the vibratory feeder bowl to the support surface. Thus,the associated equipment was ready to test and classify another chiplong before the transfer arm could deliver another chip to the supportsurface. In the usual application it is desirable that a large number ofchips be sorted in a given unit of time.

The present invention incorporates modifications of the previouslydeveloped system which substantially overcome the foregoing and otherlimitations. Accordingly, the present system avoids the problem ofspurious electrical transients by utilizing a clutch in conjunction witha continuously running motor. The time elapsing between sorting of aclassified chip and delivery of another chip to be classified isminimized by operating the clutch to operatively disconnect the transferarm from the motor when the nozzle, with the chip to be classified, isat an intermediate position between the vibratory feeder bowl and thesupport surface.

The present invention advantageously is adapted for operation in eithera semiautomatic or an automatic mode. Also, in both modes, timesequential and time concurrent operations occur between the mechanicalcycle and the contacting cycle without interference, despite variabletesting and classifying time and fixed mechanical cycle time,

rather than pseudo sequential operations in the semiautomatic mode orfully time concurrent operations in the automatic mode, therebyeffectively reducing the total cycle time required for certainapplications, regardless of the operating mode.

A further advantage of the system of the present invention, notobtainable in the previously developed system, is that, regardless ofthe operating mode, several units comprising a transferring apparatusand a contacting apparatus can be coupled to the test and classifyingequipment via a multiplexer. The multiplexer allows time random testingof respective chips on respective support surfaces so that the highspeed ability of the classifier equipment may be efiiciently utilized.

Accordingly, it is a primary object of the invention to provide animproved sorting system.

This and other objects are accomplished in accordance with the inventionby the incorporation of a clutch arrangement relating the operation of atransferring mechanism, a contacting mechanism, and other systemcomponents in a unique fashion.

The above objects and features of the invention should become moreapparent from the following description of the invention considered withthe accompanying drawings.

Referring to the drawings:

FIG. 1 is a diagrammatic representation, in perspective, showing certainparts of a transferring mechanism utilized in a sorting system accordingto the present invention.

FIG. 2 is a plan view showing, in some detail, the arrangement of acontacting mechanism, means for receiving classified chips, and atransferring mechanism according to the present invention.

FIG. 3 is an elevational view taken along line 3-3 of FIG. 2 showing,inter alia, an arrangement whereby chips may be sorted into appropriateclassification receptacles.

FIG. 4 is an elevational view taken along line 44 of FIG. 2, showing anarrangement including a weight arm for applying and removing contactpressure.

FIG. 5 is a perspective view of the latch structure embodied in thecontacting mechanism shown in FIG. 2.

FIG. 6 is a detail drawing illustrating the operation of certainelements shown in FIG. 5.

FIGS. 7 and 8 are elevational views, taken along lines 7 and 8respectively of FIG. 2, showing in some detail the structure of thecontacting mechanism.

FIGS. 9-13 are schematic representations illustrating the operation ofthe contacting mechanism.

FIGS. 14 and 15 are respective side and front views showing certaindetails of a motor, clutch and associated parts comprising part of thecombination shown in FIG. 1.

FIG. 16 illustrates the operation of the valving shown in FIG. 1.

FIG. 1 shows, in perspective, a generalized view of transferringmechanism wherein hollow transfer arm 12 is operated by motor 14, backand forth between the pickup point on vibratory feeder bowl 16 andplatform 18 of a contacting station. Clutch 20, mounted on the motorshaft, supports rotary shutter plate 22.

Clutch 20 is comprised of three coaxial members 24-, 26, and 28. Member26 has a ramp 30 defining a radial face which is engageable with a faceor shoulder on spring biased lever 32. Solenoid 34 is energizable topull lever 32 out of the way of the ramp face.

Vacuum pump 36, flapper valves 38 and 40, and trans fer arm 12 areinterconnected by flexible tubing 42. Transfer arm 12 has a vacuumnozzle 44 for picking up chips. In FIG. 1, nozzle 44 is shown proximateto platform 18.

Ball bearing 46 is held in a socket on support 48 by means of springbiased rectangular frame 50 which has a detent inserted in a dimple ofball bearing 46. Bearing pin 52 extending through a guide slot in guidemember 54 aids in the retaining of ball bearing 46 in the aforementionedsocket.

Rod 56 interconnects rotatable clamp plate 58 and rotatable member 60.Large gear 62, which is coaxial with member 60, and driven thereby,meshes with small gear 64. Radial arm 66 connects transfer arm 12 toshaft 68. Piston rod 70 connects piston 72 within air cylinder 74 tosmall gear 64. Finally photocell 76 and radiant energy source 78 aredisposed on opposite side of shutter plate 22.

The basic operation of the FIG. 1 structure is as follows: Solenoid 34is energized, lever 32 disengages the radial face of ramp 30, clutch 20couples, and clamp plate 58 rotates one complete revolution. Rotation ofclamp plate 58 is converted into transfer arm motion via theintercoupling provided by rod 56, rotatable member 60, gears 62 and 64,and radial arm 66. Accordingly, transfer arm 12 pivots about bearing 46,and nozzle 44 travels in an arcuate path from an intermediate position,halfway between vibratory feeder bowl 16- and platform 18, to platform18, returns to vibratory feeder bowl 16, then travels back to theintermediate position. The face on lever 32 again engages the radialface defined by ramp 30, clutch 20 decouples, and transfer arm 12 isheld in the intermediate position.

FIG. 2 shows, inter alia, contacting mechanism 80, sorting apparatus 82,and alignment device 84. Contacting mechanism 80 comprises contact arms86 attached to carriage 88, and weight arm 90. Platform 18 of alignmentdevice 84 may be rotated or translated by twirling and pivoting controlstick 92. Alignment device 84 is disclosed in application Ser. No.733,347, filed May 31, 1968 by the same applicant, assigned to the sameassignee and entitled Mechanical Alignment Device. Conical frame member94 is disposed over solenoid controlled guide tubes 96. Each guide tube96 is connected to a respective receptacle 98.

In FIG. 3 receptacle 98 and associated guide tube 96 are showninterconnected by member 100. Member 100 circumscribes the bottomportion of tube 96 and is pivoted on pin 102. Solenoid 104 is connectedto member 100 so that when solenoid 104 is energized tube 96 moves tothe dotted position shown so that it may receive a chip from chute 106and direct it into receptacle 98. Collar 108 cusures accuratepositioning of the mouth of guide tube 96 under chute 106. Spring 110 isconnected between member 100 and flange 112 so that when solenoid 104 isnot energized tube 96 is biased into engagement with resilient stop 114which is attached to frame member 94.

FIG. 4 shows weight arm 90 pivoted on pin 116 and rocker element 118pivoted on pin 120. Rocker portion 122 is engageable with a roller 124(shown by dotted lines) which is secured to weight arm 90 by pin 126.Portion 122 normally rests on sleeve 128. When pin 130 engages rockerportion 132 and travels upward, rocker element 118 pivots about pin inthe clockwise direction whereby weight arm 90 is caused to pivotclockwise about pin 116. Thus, portion 134 of weight arm 90, is liftedto relieve contact pressure from underlying contact arms 86 (shown inFIG. 2).

After rocker portion 132 has been thus lifted, subsequent downwardtravel of pin 130 allows rocker element 118 to pivot counterclockwise toreturn to the initial position shown wherein rocker portin 122 againrests on sleeve 128 so that weight arm 90 returns to its initialposition wherein weight arm portion 134 again applies contact pressureto contact arm 86 (not shown).

FIG. shows, in perspective, an arrangement for latching contactingmechanism '80. Latch member 140 is pivot ed on pivot pin 142. Bracket144, secured to member 140, has a rear portion 146 resting on surface148. Triangular piece 150 is supported between bracket leg portions 152by pin 154. Shaft 156 is connected to gear 62 (shown in FIG. 1). Plate158 is clamped to shaft 156 by clamp screw 160. Leg portion 162 of plate158 extends rearwardly so as to be engageable with the bottom surface ofplate 164. Plate 164 is loosely mounted on shaft 156 whereby plate 164and shaft 156 may move relative to each other. Plate 164 carries latchmember 166 shown in locking engagement with notch 168 on latch member140. Plate 164 also carries elongated pin 130 to which permanent magnet170 is attached. Magnetic reed switch 172 is stationarily positioned sothat when plate 164 is free to fall under gravity, magnet 170 willactuate switch 172. Switch 172 controls circuitry (not shown) whichgenerates a control signal. Plunger 174, shown with its intermediateportion cut away, has a conical member 176 at one end and a push button178 at its other end. Spring 180 normally biases plunger 174 so thatconical member 176 is normally disengaged from triangular piece 150.Latch member 140 may be lifted and member 182 rotated thereunder toeffectively prevent latching of members 140 and 166.

FIG. 6 shows plunger 174 with its conical member 176 in the normalposition. When it is desired to disengage latch member 166 from notch168, button 178 is pushed inward. Upon inward motion of plunger 174,conical member 176 first slidably engages triangular piece 150 therebylifting the associated portion of latch member 140 and rotating latchmember 140 clockwise about pivot pin 142 so that latch member 166 clearsnotch 168 and plate 164 is free to fall under gravity. Conical member176 then passes underneath the uplifted triangular piece 150 to thefully actuated position (shown by the dotted lines) wherein conicalmember 176 clears or is disengeged from triangular piece 150. Upondeactuation or release of button 17 8 the plunger 174 returns to itsnormal position. During this return motion conical member 176 pushestriangular piece 150 ahead of it, thereby rotating triangular piece 150counterclockwise (as indicated by the dotted lines) about pivot pin 154without moving or lifting latch member 140. This feature insures properoperation of the latch arrangement.

In FIG. 7, weight arm 90 is shown pivoted on pin 116 which is supportedby respective portions of frame member 190. Plunger 174, extendingbetween button 178 and conical member 176, is biased to the left byspring 180 mounted in chamber 192 of member 194. Rocker element 118 ispivoted on pin 120.

FIG. 8 shows details of one embodiment of a contacting mechanism '80. Inthis embodiment test platform 18 is an elongated conductive metal platehaving inclined surface portion 202 separated from main body 204 byinsulating material 206. Chute 106, held in a vertical aperture in mainbody 204 by set screw 208, has a peripheral longitudinal slot facingtest platform 18 so that chips can be directed from platform 18 intochute 106 when ejector arm 210 is extended to the left. The right end ofejector arm 210 is pivoted on a pin extending from lever 212.

Lever 212 in turn is pivoted on pin 214 extending from lever 216. Levers216 and 218 are both pivoted on pin 120. Levers 212 and 218 are coupledtogether by pin 220 and slot 222 in lever 218.

Spring 226, connected between portion 228 of lever 218 and post 230mounted in an aperture in frame member 190, biases lever 218 to theposition shown. Two springs,

such as spring 234, extend between respective posts 236 on lever 216 andposts on frame member 190 similar to post 230.

Spring 238 is secured at one end to main body 204 by screw 240. Theother end of spring 238 has a V-shaped portion normally resting on topof stop 242 which is integral with lever 216. Notch 244 on lever 212 cancapture spring 238. One or more contact arms 86 are secured to contactcarriage 88 by screws 246. Carriage 88 is an insulating body havingapertures receiving contact terminals 248. Test and classifyingequipment 250, which may comprise various automatic digital testequipment, is connected to terminals 248 so that when contact arms 86contact engage a chip on platform 18 the chip may be electricallycoupled thereto. A detailed description of equipment 250 is deemedunnecessary for proper understanding of the invention.

FIGS. 9-13 are diagrammatic representations illustrating the sequentialoperation of contacting mechanism shown in FIGS. 7 and 8. In FIG. 9 pin130 has traveled in the clockwise direction from the dotted position tothe shown position. Contact arm 86 is in contact engagement with a chipon platform 18. Pin 130 in the shown position engages rocker element 118(shown in FIG 4). Continued clockwise travel of pin 130 first causesweight arm 90 (shown in FIG. 4) to lift, thus relieving contact pressurefrom contact arm 86. Pin then engages lever 218 causing ejector arm 210to move to the left whereupon the left end of ejector arm "210 rides upthe inclined surface 202 to lift contact arm 86 away from the chip.Subsequently ejector arm 210 sweeps the chip into chute 106 as shown inFIG. 10.

Pin 130 then continues its clockwise travel until lever 212 abuts stop242. Lever 216 then is rotated clockwise to the position shown in FIG.11 so that contact arm '86 and ejector arm 210 are both fully retractedto allow a chip to be placed on platform 18.

In the semiautomatic version, pin 130 is latched in its FIG. 11 positionby the latching mechanism shown in FIG. 5 until plunger 174 is actuatedwhereupon pin 130 reverses its direction of movement and travels in thecounterclockwise direction. In the automatic version, pin 130, uponreaching the FIG. 11 position, immediately reverses direction. In bothinstances counterclockwise travel of pin 130 allows lever 216 to movecounterclockwise so that contact arm 86 moves to the left until itsforward end overlies the newly deposited chip, at which time ejector arm210 has advanced halfway to the left so that its left hand is resting atthe top of the inclined surface 202 on platform 18. Spring 238 hasentered slot 244 of lever 212, retaining ejector arm 210 in the halfwayposition so that contact arm 86 is held out of contact engagement withthe newly deposited chip. FIG. 12 shows the position of various elementsafter these events have occurred.

Upon continued counterclockwise travel of pin 130, spring 238 snaps outof slot 244, and lever 212 rotates clockwise whereupon the left end ofejector arm 210 rides down the inclined surface of platform 18 thusallowmg contact arm 86 to contact the newly deposited chip. Shortlythereafter, pin 130 disengages rocker element 118 to permit weight arm90 to apply contact pressure to contact arm 86.

FIG. 13 shows the position of the elements after these events haveoccurred.

Subsequent further counterclockwise travel of pin 130 brings it to thedotted position shown in FIG. 9 thus completing the operation cycle ofthe contacting mechanism.

In FIGS. 14 and 15 parts of the structure are shown cutaway or shown incross section so that the details thereof may more readily be explained.Clutch 20, mounted on a shaft extending from motor 14, is situatedwithin aperture 260 of vertical support 262. Photocell 76 is mounted insupport 262 across from radiant energy source 78. Annular shutter plate22 has an aperture 264 which can be rotated into position betweenphotocell 76 and source 78. Shutter plate 22 is clamped between annularclamp plates 58 and 266 which are secured together by screws such as268.

The assembled clamp and shutter plates are secured to mounting hub 28 ofclutch 20 by one or more peripheral set screws such as 272. By looseningset screw 272, rotating the assembly relative to mounting hub 28, andretightening set screw 272 any desirable angular orientation of aperture264 can be obtained. The end 274 of rod 56 is mounted on pin 276extending from plate 58.

Clutch 20 comprises, in addition to mounting hub 28, shaft adapter 24and intermediate shell 26. A helical spring inside shell 26' woundcounterclockwise, has one end portion captured in a slot in shell 26adjacent shaft adapter 24 and the other end captured in a slot inmounting hub 28. Ramp 30 on shell 26 defines a radial face 278, the edgeof which can be seen in FIG. 14. When motor 14 rotates clockwise thehelical spring winds, thus coupling mounting hub 28 to shaft adapter 24,and hub 28 is driven clockwise. When shell 26 is restrained fromrotating the helical spring unwinds, thus uncoupling hub 28 from shaftadapter 24. Clockwise rotation of motor 14 is inetfective to drive hub28.

In order to restrain shell 26 from rotating, declutching lever 32 isprovided. Lever 32 is pivoted on screw 280 attached to vertical support262 and spring biased toward shell 26 by spring 288. Lever 32 is formedto define a shoulder surface 284, extending radially of shell 26, whichwhen engaged with radial face 278 restrains shell 26 from any furtherclockwise rotation.

Lever 286 is pivoted on screw 280, biased toward shell 26 by spring 282,has a length less than the length of lever 32 from its pivoted end tosurface 284; and functions as an antireverse lever. The top edge oflever 286 and the surface 284 of lever 32 define a pocket in which pin292 extending from plate 266 may be captured. Pin 292 is disposed onplate 266 a few degrees counterclockwise relative to face 278 of shell26. Lever 286 functions as an antireverse lever in that when face 278rotates into engagement with face 284, inertia allows mounting hub 28 tocontinue rotating for a short time. During this time pin 292 falls intothe pocket whereupon the top surface of lever 286 prevents mounting hub28 from momentarily reversing direction as would otherwise occur. Thisfeature is important when a very small, lightweight chip is beingtransported by transfer arm 12.

Solenoid 34 is held adjacent vertical support 262 by clamp 294. Thesolenoid plunger is connected to lever 32 'by linkage 296. When solenoid.34 is energized, lever 32 pivots counterclockwise and face 284 movesout of the path of face 278 of shell 26.

Lever 298- is pivoted on screw 300 extending from vertical support 262and normally rests upon lever 32. When solenoid 34 is energized andlever 32 rotates counterclockwise, lever 298 pivots and drops onto shell26 to prevent lever 32 from returning to its original position whensolenoid 34 is deenergized. Lever 298 is thus in the path of travel ofpin 292 so that pin 292 will subsequently lift lever 298 to its originalposition whereby spring 282 can return lever 32 to its originalposition.

FIG. 16 shows flapper valves 38 and 40' with respective spring biasedflappers 310 and 312 arranged for actuation by pin 276 which is mountedon clockwise rotating shutter 22. Valves 38 and 40 are connected in.series between transfer arm 12 and vacuum pump 36. For proper timing ofthe valving operation relative to transfer arm movement, flappers 310and 312 normally close respective valve bypass openings. As pin 276passes through the position shown, transfer arm 12 is in the vicinity oftest platform 18, and flapper 310 uncovers the respective val-ve bypassopening to relieve vacuum at nozzle 44. When pin 276 passes through thedotted 8 position, transfer arm 12 is in the vicinity of vibratoryfeeder bowl 16, and flapper .312 uncovers the respective valve bypassopening to relieve the vacuum at nozzle 44. Accordingly, operation offlapper valves 38 and 40 occurs at the proper time in the transfer armcycle so that a chip may be picked up at the feedout point of vibratoryfeeder bowl 16 and transported to test platform 18 where the chip isreleased.

The operation of the sorting system in the automatic mode can besummarized as follows:

Assume that contact arms 86 are contacting a first chip on platform 18and that testing and classifying of the first chip is in progress (FIG.8). Further assume that nozzle 44 is stationary and holding a secondchip at a position half way or intermediate between feeder bowl 16 andplatform 18. At this time radial face 278 engages shoulder 284 of lever32- so that clutch 20 is decoupled. At this time shutter plate aperture264 is in the bottommost position shown in FIG. 14.

The FIG. 5 latching arrangement is rendered inoperative by resting latchmember 140 on member 182 which has been pivoted underneath the adjacentportion of latch member 140.

Upon completion of testing and classifying, equipment 250 is operativeto send, by appropriate means, an electrical signal to solenoid 34whereby lever 32 is retracted and shoulder 284 and radial face 278disengaged. Nozzle 44 now begins movement towards platform 18.

Equipment 250 concurrently actuates a selected solenoid 104 (FIG. 3),depending upon the classification assigned to the first chip by theequipment. As a result of the latter signal the mouth of the associatedguide tube 96 moves into position underneath shoot 106 and, by suitablecircuitry, is held in this new position until the solenoid 104 isdeactuated in a manner which is to be described hereinafter.

As nozzle 44 approaches platform 18 with the second chip, pin 130 firstengages rocker element 118 of FIG. 4 removing the contact pressureweight arm fro-m contact arms 86. Pin subsequently engages lever 218 sothat ejector arm 210 pushes the first chip into shoot 106 which directsthe chip into the selected guide tube 96. Ejector arm 210 and contactarms 86 then move away from the platform in time to allow nozzle 44 todeposit the second chip on platform 18. At this time pin 276 actuatesflapper 310 of valve 38 (FIG. 16). Vacuum at nozzle 44 collapses for ashort time and the second chip is deposited or dropped onto platform 18.

Transfer arm 12 now reverses direction and begins to return to bowl 16.Pin 130 also reverses direction so that shortly after the second chiphas been deposited, contact arms 86 move over the second chip. Contactarms 86 then drop into contacting engagement with the second chip andcontact pressure is applied by weight arm 90. Contact arms 86 bounce fora time due to their spring constant. The foregoing events occur beforetransfer arm has travelled half way back towards bowl 16.

By the time transfer arm 12 reaches a position half way back to bowl 16the contact arms 86 have ceased to bounce. At this time, shutteraperture 264 passes between photocell 76 and light source 78. When thisoccurs, a signal is sent to equipment 250 indicating that testing of thesecond chip can commence. Additionally, a second signal is sent todeactuate the selected solenoid 104, by suitable means associated withthe equipment 250, whereby the associated guide tube returns to itsquiescent condition. The second chip is subsequently tested andclassified. As nozzle 44 of transfer arm 12 arrives at bowl 16, pin 276actuates flapper 312 of valve 40 (FIG. 16) and vacuum at nozzle 44collapses, for a short time. When flapper 312 returns to itsnon-actuated position, vacuum at nozzle 44 resumes, causing transfer arm12 to pick up a third chip from the feedout point of bowl 16.

Transfer arm 12 then moves toward platform 18. When it reaches theintermediate position halfway toward platform 18, radial face 278 ofclutch shell 26 engages shoulder face 284 of lever 32 to decoupletransfer arm 12 from motor 14 in the event that another signal has notbeen received by solenoid 34. Transfer arm 12 waits in this positionuntil another signal is received by solenoid 34 whereupon the foregoingcycle of events is repeated. Of course, if solenoid 34 has receivedanother signal prior to the time radial face 278 has reached the clutchdecoupling position, then transfer arm 12 proceeds in an uninterruptedmotion through the intermediate position to deliver the third part toplatform 18 and thereby complete another operation cycle.

In the semiautomatic mode the operation cycle is similar to that of theautomatic mode with only a few variations. In the semiautomatic mode,the latch arrangement shown in FIG. is utilized whereas in the automaticmode, it is not. In the automatic mode shutter plate aperture 264 servesthe dual function of signalling to cause de-energization or resetting ofthe selected solenoid 104 and also indicating that testing andclassifying can commence. The aperture 264 retains its function ofallowing light from light source 78 to impinge upon photocell 76 fordeactuation or resetting of the selected solenoid 104.

In operation, assume that the latching arrangement of FIG. 5 is latchingcontacting mechanism 80 in the position shown in FIG. 11, that a firstchip is on platform 18, that nozzle 44 is stationary halfway betweenfeeder bowl 16 and platform 18, and is carrying a second chip. When theoperator presses button 178, conical member 176 (FIG. 5) causes latchmembers 166 and 140 to disengage whereupon plate 164 rotatescounter-clockwise. As plate 164 rotates, contacting mechanism 80operates to move contact arms 86 to the position shown in FIG. 13.Shortly thereafter, permanent magnet 170 (FIG. 5) arrives adjacentmagnetic reed switch 172 producing a signal which is sent to equipment250 to indicate that testing of the first chip can commence.

Testing and classifying of the first chip then occurs. After testing andclassifying has been completed, equipment 250 sends a signal to aselected solenoid 104 (FIG. 3) and a signal to solenoid 34 (FIG. 1).Clutch 20 recouples and transfer arm 12 proceeds to deliver the secondchip to platform 18.

The first chip is ejected, the second chip is placed on the platform 18,and nozzle 44 returns toward feeder bowl 16. When nozzle 44 is halfwayback to feeder bowl 16, shutter plate aperture 264 passes betweenphotocell 76 and light source 78 whereupon the selected solenoid 104 isdeactuated and returned to its quiescent position.

Thus, it can be seen that in both the semiautomatic and automatic modes,an electrical signal is developed in an appropriate time in themechanical cycle of transfer mechanism to allow testing and classifyingof a chip to proceed. Furthermore, in each mode a signal is developed atthe end of the testing and classifying cycle to induce or start anothermechanical cycle. In both instances, this start signal is mechanicallystored if the previous mechanical cycle has not yet been completed, thusallowing the transferring mechanism to continue without stopping throughanother subsequent mechanical cycle.

Operation of the system in the automatic mode is initiated byappropriately inducing an electrical signal to artificially indicate thecompletion of testing and classifying in order that a first chip may bedeposited on platform 18. Thereafter the system operates in theautomatic mode in the manner set forth above.

The above described system is quite versatile in that it may be utilizedfor sorting a wide variety of miniature parts (chips) having differentsize, weight, and geometric features. Accordingly, miniature metalpieces, film resistors, glass pill diodes, various types ofsemiconductor flip-chips, and other miniature parts may be sorted. Wheresemiconductor flip-chips are being handled, visual inspection formissing conductive bumps is possible. The semiautomatic mode makespossible the visual alignment of miniature parts prior to contacting.Various contact carriages may be provided with as many contact arms asdesired. Thus, for example, the bumps of a semiconductor flip-chip canbe aligned for contacting by a corresponding member of contact arms.

It should be appreciated that while the foregoing description hasreference to particular structure, especially adapted for sorting chips,nevertheless, the inventive concepts embodied in the invention arereasonably adapted for incorporation in analogous situations whereminiature items or chips are to be handled for a variety of purposes.

Accordingly, various changes and modifications, obvious to one skilledin the art, are deemed to be within the scope of the invention.

What is claimed is:

1. Chip sorting apparatus comprising:

a chip supply station and a chip classifier station;

means for transferring chips, in sequence, from said supply station tosaid classifier station;

means for routing chips from said classifier station in accordance withan assigned classification;

means for delaying transfer of a consecutive chip for a time directlyrelated to the time required for classifying the immediately precedingchip when the required time exceeds a time predetermined by thesynchronous operation of said transferring means and said classifierstation.

2. In a chip routing apparatus, the combination of:

respective first and second synchronously operable mechanismscooperating to respectively deliver consecutive chips to a classifierstation and to route such chips therefrom;

said second mechanism being operable to route each chip in accordancewith the classification assigned thereto at said classifier station; and

means for idling said first mechanism for a time dependent upon theclassification time of the previous chip.

3. Apparatus for routing chips from a chip feed station to respectiveclassifier receptacles comprising:

a chip classification station where chips are respectively assignedclassifications in accordance with a parameter thereof;

a first mechanism for transferring a chip from said chip feed station tosaid chip classification station;

a second mechanism for routing such chip from said classificationstation in accordance with the assigned classification;

synchronizing means coupled to said mechanisms to correlate theoperation cycles of said mechanisms;

said mechanisms being operable through repetitive cycles to thereby sortconsecutive chips; and

means for lengthening the cycle time of said first mechanism inproportion to the time required to classify an immediately precedingdelivered chip in excess of a predetermined portion of the cycle time ofsaid first mechanism.

4. The apparatus of claim 3 wherein said second mechanism includes guidemeans for receiving a classified chip and directing such chip inaccordance with the assigned classification into one of said classifierreceptacles.

5. An electromechanical system for sorting a plurality of initiallyunclassified chips in accordance with an assigned classificationcomprising:

a first station for supplying unclassified chips to a chip carriermeans;

a second station including a surface for receiving such chips from saidchip carrier means;

a chip transfer mechanism including drive means coupled to said chipcarrier means to repeatedly cycle and move said carrier means back andforth between 1 1 said stations to thereby successively deliver chipsfrom said first station to said second station; said second stationfurther comprising movable chip contacting means and movable chipremoving means;

mechanical means for repeatedly cycling and moving said contacting meansand said removing means to successively permit each unclassified Chip tobe placed on said surface, subsequently contacted by contacting means,and thereafter ejected from said surface by said removing means;

test and classifying means coupled to said contacting means and to saidchip transfer mechanism for testing and classifying each chip duringcontacting thereof and for controlling the operation of said chiptransfer mechanism;

coupling means relating the mechanical cycles of said chip carrier meansand said chip removing means to the time required for testing andclassifying of each chip so that any chip on said surface will beremoved therefrom prior to the placing of a successive chip thereon; and

said coupling means including clutch means capable of stopping saidcarrier means at an intermediate position to delay delivery of asuccessive chip for a time dependent upon the time required for testingand classifying and otherwise permitting uninterrupted operation of saidtransferring mechanism.

6. The system of claim 5 further including latchable means forpreventing the aforementioned chip contacting by said contact means, andmanual means to unlatch said latchable means to allow the aforementionedchip contacting to proceed.

7. The system of claim 5 wherein said mechanical means includesactuatable lever means for producing the aforementioned movement of saidcontacting means and said removing means.

8. In a chip-handling system for sequentially transporting, contacting,and sorting chips having chip supply and chip-contacting stations and achip-transferring mechanism having chip-carrier means movable back andforth between said stations to alternately transport a chip from saidchip-supply station to said chip-contacting station and to return tosaid chip-supply station to obtain another chip, a contacting mechanismoperable in synchronous relation with said carrier means to contact eachchip subsequent to placement thereof on said chip-contacting station,drive means for said carrier means and said contacting mechanism toproduce the aforemention synchronous operation, and coupling meanscoupled between said drive means and said transferring mechanism, theimprovements comprising:

said drive means being continuously operable during the aforementionedtransporting, contacting and sortsaid contacting mechanism being adaptedto permit testing and classifying of chips placed on saidchip-contacting station and to accommodate derivation of a controlsignal in timed relationship with each testing and classifyingoperation,

clutch means incorporated within said coupling means and normallyoperable to decouple said carrier means from said drive means at a timein the operation cycle of said carrier means when said carrier meansarrives at an intermediate position between said stations with a chipcarried thereby; and

control means operable in response to the control signal to render saidclutch means inoperative and to permit uninterrupted motion of saidcarrier means through said intermediate position to said chip-contactingstation.

9. In a system for transporting, contacting, and sorting chips, thecombination of:

a chip feed station and a chip test station, carrier means movable in afirst direction to transport a chip from said chip feed station to saidchip test station and movable in a second direction to return from saidchip test station to said chip feed station;

contact means operative to permit testing and classifying of each chipat said chip test station;

clutch means coupled between a drive means for said carrier means andsaid carrier means, said drive means being continuously operable duringthe aforementioned transporting, contacting, and sorting of chips;

said clutch means including latch means, latchable at a predeterminedtime during the movement of said carrier means in the first direction,to stop said carrier means in an intermediate position and thereby delaythe placement of a chip on said chip test station until such time astesting and classifying of a previously delivered chip at said chip teststation has been completed; and

control means for moving one member of said latch means upon completionof the aforementioned testing and classifying so that said carrier meansmay proceed uninterrupted or after a time delay to said chip teststation.

10. An electromechanical system for successive sorting of each of aplurality of chips into respective classification receptacles inaccordance with an assigned classification comprising:

a first station for supplying chips and a second station for testing andclassifying such chips;

said second station comprising a chip receiving surface disposedadjacent a plurality of chip classification receptacles;

a chip transfer mechanism having carrier means driven by a drive meansto successively transport chips and to repeatedly deliver consecutivechips from said first station to said second station and return to saidfirst station;

means for testing and classifying chips coupled to movable contactmeans;

said movable contact means together with a chip removal means comprisingpart of a contacting mechanism;

said movable contact means and said chip removal means each beingmovable relative to said chip receiving surface to permit placement ofeach successive chip on said chip receiving surface by said carriermeans, contacting of each such chip by said contacting means, andremoval of each such chip from said chip receiving surface subsequent totesting and classifying thereof;

synchronizing means relating the movements of said mechanisms to thetime required for completion of testing and classifying of eachpreviously delivered chip so that each such chip may be removed fromsaid surface prior to the placement of a successive chip thereon;

said coupling means including means capable of stopping movement of saidcarrier means to delay delivery of a chip for a time dependent upon thetime required to test and classify the previously delivered chip whenthe required time exceeds a predetermined time and for otherwisepermitting uninterrupted delivery of the successive chip.

11. The system of claim 10 including means for delaying operation of theaforementioned testing and classifying means for a time after initialcontacting of a chip by said contacting means.

12. An electromechanical system for sorting a plurality of chipscomprising:

a first station for supplying unclassified chips to a chipcarrier means;

a second station including a surface to receive chips from saidchip-carrier means;

a chip-transfer mechanism, including said chip-carrier means, and beingoperative in each cycle of operation to move said chip-carrier meansback and forth between said stations;

said chip-carrier means being operative to successively deliverconsecutive chips from said first station to said surface;

a chip-contacting mechanism, including said surface, having movablecontacting means for contacting each consecutive chip, while on saidsurface, and chipremoval means for subsequently removing such chipduring the cycle of operation of said chip-contacting mechanism; and

test and clasifier means coupled to said contacting means for testingand classifying each chip during contacting thereof, and means coupledto said test and classifier means for producing repetitive synchronousoperation of said chip-transfer and chip-contacting mechanismsregardless of the time interval required for each testing andclassifying operation.

13. An electromechanical system for performing successive sortingoperations on each of a plurality of consecutive chips comprising:

a first station for supplying unclassified chips and a second stationfor testing and classifying such chips; transporting means fortransporting chips from said first station to said second station;

said second station including a surface adapted to receive a chiptransported to said second station by said transporting means;

contacting means operable at said second station and adapted to coupleeach received chip to test and classifying means;

removal means to remove each received chip after classifying thereof bysaid test and classifying means; and

means for idling said transporting means for a time proportionate to thetime required to classify an immediately preceding delivered chip whenthe required time is in excess of a predetermined time.

.14. Apparatus for routing chips from a chip feed station to respectiveclassifier receptacles comprising:

a first mechanism for delivering a chip to a classifier station wheresuch chip is assigned a classification in accordance with a parameterthereof;

a second mechanism for routing such chip from said classifier station inaccordance with the assigned classification;

synchronous means relating the operation cycles of said first and secondmechanisms;

said mechanisms being operable through repetitive cycles to thereby sortconsecutive chips; and

means for prolonging the chip delivery time of said first mechanism fora time corresponding to the time required to classify an immediatelypreceding delivered chip in excess of a predetermined time interval.

15. In a system for transporting, contacting, testing, classifying, andsorting chips including: chip feed and chip test stations, a chiptransferring mechanism having a chip transfer arm for transporting chipsfrom said chip feed to said chip test station, a contacting mechanismhaving contacting means for contacting chips at said chip test stationto permit testing and classifying of such chips, and coupling meansrespectively connecting both mechanisms to a drive means so as to relatethe operation cycles of such mechanisms, the improvements comprising:

said drive means being continuously operable during transporting,contacting, testing, classifying, and sorting of chips; said couplingmeans including electromechanical clutch means for mechanical decouplingsaid mechanisms from said continuously operable drive means during thechip-transporting portion of the operation cycle of saidchip-transferring mechanism; and

said clutch means being arranged so that the aforementioned decouplingarrests transfer arm motion at an intermediate position between saidstations whereby said transfer arm is stopped at the intermediateposition.

16. The system of claim 15 wherein said electromechanical clutch meansincludes electromechanical means operable in response to an electricalsignal to alternately permit the resumption of transfer arm motion fromthe intermediate position or to prevent the aforementioned decoupling tothereby permit said transfer arm to uninterruptedly pass through theintermediate position to complete the chip transporting portion of thetransfer arm operation cycle, depending upon the time in the transferarm cycle the electrical signal is received by said electromechanicalmeans.

17. The system of claim 16 further including means for operating thesystem automatically or semiautomatically.

18. The system of claim 15 wherein said transfer arm has a vacuum nozzlefor carrying chips, and further comprising means for inducing andrelieving vacuum at said nozzle in timed relationship to the movement ofsaid transfer arm.

19. The system of claim 15 including means for pivot ing said transferarm about a first point and including a vacuum nozzle carried by saidarm which is movable back and forth between said chip feed and chip teststations during the aforesaid pivoting.

References Cited UNITED STATES PATENTS 2,999,587 9/ 1961 Campbell 209-733,209,908 10/1965 Hopkins 209-81 3,252,571 5/1966 Hinkle et a1. 209813,282,420 11/1966 Frechette 209-81 X 3,363,179 1/1968 McCutcheon -20981X 3,384,236 5/ 1968 Best et a1. 209-81 ALLEN N. KNOWLES, PrimaryExaminer US. Cl. X.R. 209-81

